Wafer carrier trays are designed for storage, transport and handling of semiconductor wafers, glass wafers or other delicate flat objects.
Established in 1993, Rite Track is the leading supplier of customized remanufactured track systems, focused on extending the value of production equipment for the semiconductor, MEMS, LED, thin film head and solar cell industries.
Rite Track plans to provide global parts and service support for existing products once the transfer is complete, as well as new, updated versions of the CV product line in the near future.
Rudolph is a worldwide leader in the design, development, manufacture and support of defect inspection, process control metrology, and data analysis systems and software used by semiconductor device manufacturers worldwide.
Rudolph Technologies will be contacting existing customers with a formal letter providing further information to affect a smooth transfer of support. In conjunction, Rite Track will announce an official support start date once transfer plans are formalized.
“The Rudolph CV product line adds an exciting extension to our product mix that fills an industry void for affordable wafer cassette inspection equipment,” said Tim Hayden, Rite Track’s President & CEO. “Customers can expect the same award winning, global parts and technical support Rite Track offers on its existing products, thus extending the CV Series product life for many years to come.”
Rite Track will manufacture the CV product line from its worldwide headquarters in West Chester Twp., but with no need for hiring new staffers at this point, according to Tom Parish, vice president of marketing.
“It’s possible that if this thing grew there might be some additional opportunities but at this point ... the current manpower we have in place is capable of handling and producing the products that are needed,” he said.
Parish said he could not disclose the particulars of the deal, the amount of revenue Rite Track generates annually or the size of its workforce.
Staff writer Eric Schwartzberg contributed to this report.